IEC 63616:2025 pdf download,Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies – Balanced-type circular disk resonator method.
IEC 63616:2025 specifies a method for measuring the conductivity of thin metal films at microwave and millimeter-wave frequencies. This method is designed for evaluating the conductivity of a metal foil attached to a substrate or the interfacial conductivity of a metal layer deposited on a dielectric substrate. By utilizing the higher-order modes of a balanced-type circular disk resonator, the technique enables broadband conductivity measurements with a single resonator.