IEC 61788-15:2026 pdf download,Superconductivity – Part 15: Electronic characteristic measurements – Intrinsic surface impedance of superconductor films at microwave frequencies.
IEC 61788-15:2026 is the 15th part of the IEC 61788 series, specifying electronic characteristic measurements for superconductors, focusing on the intrinsic surface impedance (Zs) of high‑temperature superconductor (HTS) films at microwave frequencies. It replaces the 2011 edition, introducing technical revisions like expanded uncertainty analysis and round‑robin test data.
The standard adopts a modified two‑resonance mode dielectric resonator method to measure Zs, targeting frequencies up to 40 GHz, film thicknesses above 50 nm, and a resolution of 0.01 mΩ at 10 GHz. Key objectives include obtaining the temperature dependence of intrinsic Zs and reporting data at the measured frequency and scaled to 10 GHz, using the f² rule for surface resistance (Rs) and f rule for surface reactance (Xs) for consistency.
It details apparatus setup, calibration, measurement procedures, and uncertainty evaluation, covering unloaded quality factor, loss tangent, and temperature control. It also mandates test report content for full traceability.
As a critical reference for HTS microwave devices (filters, antennas, resonators), it ensures accurate, repeatable Zs characterization, supporting material development, performance verification, and quality control in superconductivity research and industrial applications.
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Language:English