IEC 63185:2025 pdf download,Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method.
IEC 63185:2025 introduces a refined measurement technique for assessing the complex permittivity of dielectric substrates specifically at microwave and millimeter-wave frequencies. This method has been meticulously designed to analyze the dielectric characteristics of low-loss materials that are essential for microwave and millimeter-wave circuits and devices. By employing higher-order modes of a balanced-type circular disk resonator, this approach enables comprehensive broadband measurements of dielectric substrates using a single resonator. Notably, it accurately considers the influences of excitation holes and fringing fields through a detailed mode-matching analysis.
This second edition supersedes the initial version released in 2020 and represents a significant technical update. Key enhancements in this edition include:
a) An expansion of the applicable frequency range, now extending from 110 GHz to 170 GHz, allowing for broader applications in high-frequency scenarios.
b) The inclusion of circular disk resonators equipped with waveguide interfaces, enhancing the versatility and accuracy of the measurements.
c) A more precise calculation of complex permittivity from the measured resonant properties, with fringing fields being meticulously accounted for based on the mode-matching analysis, ensuring improved reliability in the results.
These updates reflect ongoing advancements in the field, aiming to provide more accurate and comprehensive tools for engineers and researchers working with microwave and millimeter-wave technologies.IEC 63185:2025 pdf