IEC TR 63571:2025 pdf download,Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”.

IEC TR 63571:2025 outlines a methodology for deriving the lifetime of a “SYSTEM” from the lifetime of its individual “PARTS.” The document introduces a general mathematical framework along with straightforward calculation examples designed for educational purposes, making the concepts accessible to a wider audience.

While the focus is on the elements that contribute to the “SYSTEM”-level lifetime, it is important to note that software-related components, including diagnostics, are not covered within the scope of this document. This distinction allows for a concentrated examination of hardware aspects, providing clarity on how the longevity of individual parts influences the overall system performance and reliability.