IEC 62276:2025 pdf download,Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods.

IEC 62276:2025 pertains to the production of single crystal wafers made from synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS). These wafers are specifically designed to serve as substrates in the manufacturing of surface acoustic wave (SAW) filters and resonators.

This latest edition introduces several important technical updates compared to the previous version:

a) New terms and definitions, along with technical requirements, sampling frequencies, testing methods, and measurements for transmittance, lightness, and color difference for LN and LT have been incorporated to align with the evolving needs of the industry.

b) The term “inclusion,” referenced in sections 4.13 and 6.10, has been defined, addressing the absence of a definition in Clause 3.

c) Specifications for LTV and PLTV, along with detailed descriptions of the sampling frequencies for LN and LT, have been added, as these are critical performance parameters for the wafers.

d) Tolerances for the Curie temperature specifications for LN and LT have been included to meet the industry’s developmental requirements.

e) The measurement protocols for thickness, TV5, TTV, LTV, and PLTV have been finalized, detailing the principles and methods for measuring these parameters.

These enhancements aim to ensure that the standard remains relevant and effective in addressing the rapid advancements in technology, thereby supporting the ongoing progress and innovation within the industry.